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CESG Seminar: From Reliability to Security: Negative Bias Temperature Instability and Random Telegraph Noise in Hardware Security

February 10, 2016 @ 10:00 am - 11:00 am

Room 236C WEB

Dr. Xiaoming Chen
Post-Doctoral Researcher at Carnegie Mellon University

Abstract: The rapid development of the IC technology has raised a number of challenges in IC design. On one hand, as the technology scales, there emerges some physical mechanisms that may seriously affect the IC reliability. On the other hand, the high complexity and high fabrication cost of modern ICs have greatly promoted the globalization of the IC industry. Such globalization has led to several trustiness and security vulnerabilities of ICs. In this talk, I will demonstrate the close relation between the two issues. I will first introduce two important reliability issues in nano-scale integrated circuits: negative bias temperature instability (NBTI) and random telegraph noise (RTN), and then I will introduce my recent work on how NBTI mitigation techniques and RTN itself can be adopted in the context of hardware security and design-for-trust techniques.

Bio: Dr. Xiaoming Chen received his BS and PhD degrees from the department of electronic engineering, Tsinghua University in 2009 and 2014, respectively. Since 2014, he has been a post-doctoral researcher in electrical and computer engineering department, Carnegie Mellon University. His past and current research interests include reliability-aware circuit design techniques and algorithms, parallel numerical algorithms in circuit simulation, GPU architecture, and hardware security. His present work focuses on hardware IP protection and design-for-security techniques. He has authored and co-authored over 30 papers in refereed journals and conferences. He received 3 best paper nominations in ISLPED 2009, ASPDAC 2012 and ASPDAC 2014.

Host: Dr. Li

Refreshments provided

Details

Date:
February 10, 2016
Time:
10:00 am - 11:00 am