Service

Reviewer for

Journals:

  • IEEE Transactions on Computer-Aided Design
  • IEEE Transactions on Circuits and Systems, I
  • IEEE Transactions on Circuits and Systems, II
  • IEEE Transactions on VLSI
  • IEEE Design and Test of Computers
  • IEEE Transactions on Nanotechnology
  • IEEE Transactions on Power Electronics
  • IEEE Transactions on Semiconductor Manufacturing
  • IEEE Journal on Emerging and Selected Topics in Circuits and Systems
  • ACM Transactions on Design Automation of Electronic Systems
  • ACM Journal on Emerging Technologies in Computing Systems
  • Springer Journal of Analog Integrated Circuits and Signal Processing
  • Springer Journal of Analog Integrated Circuits and Signal Processing
  • Springer Journal of Optimization and Engineering
  • Foundations and Trends in Electronic Design Automation
  • Integration, the VLSI Journal
  • Journal of Computational Neuroscience
  • VLSI Design, Hindawi
  • Computational Intelligence and Neuroscience, Hindawi
  • Journal of Low Power Electronics (JOLPE)
  • Journal of Microprocessors and Microsystems, Elsevier
  • IET Circuits, Devices & Systems

Conferences (selected):

  • IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
  • IEEE/ACM Design Automation Conference (DAC)
  • IEEE International Symposium on Circuits & Systems (ISCAS)
  • IEEE International Symposium on Quality Electronic Design (ISQED)
  • International Joint Conference on Neural Networks (IJCNN)
  • IEEE International SOC Conference
  • ACM International Symposium on Physical Design (ISPED)
  • IEEE  Biomedical Circuits & Systems Conference (BioCAS)
  • ACM/IEEE Workshop on Timing Issues in the Specification and Synthesis of Digital Systems (TAU)
  • Frontiers in Analog CAD (FAC) Workshop
  • IEEE/ACM Design, Automation and Test in Europe (DATE)

Book Publishers:

  • John Wiley & Sons
  • Cambridge University Press